Heavy ion range measurements in some glasses using back track etching technique

Radiation Measurements

Volumn 32, Issue 4, 2000, Pages 283-287

  Randhawa, G S ^a   Virk, H S ^b  

^a KHALSA COLLEGE   (India)

^b GURU NANAK DEV UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; GLASS; HEAVY IONS; ION BEAMS; ION BOMBARDMENT; PARTICLE BEAM TRACKING; PHOSPHATES; QUARTZ;

BACK TRACK ETCHING TECHNIQUE; SODA LIME GLASS;

RADIOACTIVITY MEASUREMENT;

EID: 0034245550     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(00)00036-6     Document Type: Article

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