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Volumn 32, Issue 4, 2000, Pages 283-287

Heavy ion range measurements in some glasses using back track etching technique

Author keywords

[No Author keywords available]

Indexed keywords

ETCHING; GLASS; HEAVY IONS; ION BEAMS; ION BOMBARDMENT; PARTICLE BEAM TRACKING; PHOSPHATES; QUARTZ;

EID: 0034245550     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1350-4487(00)00036-6     Document Type: Article
Times cited : (4)

References (15)
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    • Mukherjee, S.1    Nayak, A.K.2
  • 8
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    • Price, P.B.1
  • 9
    • 0030000532 scopus 로고    scopus 로고
    • Track etching characteristics of different glass track detectors
    • Randhawa G.S., Virk H.S. Track etching characteristics of different glass track detectors. Appl. Radiat. Isot. (UK). 47:1996;351-354.
    • (1996) Appl. Radiat. Isot. (UK) , vol.47 , pp. 351-354
    • Randhawa, G.S.1    Virk, H.S.2
  • 10
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    • (1996) Nucl. Instr. Meth , vol.108 , pp. 7-10
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  • 11
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    • Study of charged particle tracks in barium phosphate (BP-1) glass
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    • Randhawa, G.S.1    Virk, H.S.2
  • 12
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.