|
Volumn 30, Issue 1, 2000, Pages 364-367
|
Temperature-programmed photoelectron emission technique for metal surface analysis
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ELECTRON EMISSION;
GEIGER COUNTERS;
OXYGEN;
ULTRAVIOLET RADIATION;
X RAY PHOTOELECTRON SPECTROSCOPY;
METAL SURFACE CHARACTERIZATION;
TEMPERATURE-PROGRAMMED PHOTOELECTRON EMISSION (TPPE);
METALLIC FILMS;
|
EID: 0034245319
PISSN: 01422421
EISSN: None
Source Type: Journal
DOI: 10.1002/1096-9918(200008)30:1<364::AID-SIA759>3.0.CO;2-W Document Type: Article |
Times cited : (17)
|
References (13)
|