Chemical analysis using XPS data and self-organizing maps

Surface and Interface Analysis

Volumn 30, Issue 1, 2000, Pages 181-184

  Obu Cann, K ^a   Tokutaka, H ^a   Fujimura, K ^a   Yoshihara, K ^b  

^a TOTTORI UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR CORRECTION; X RAY PHOTOELECTRON SPECTROSCOPY;

SELF-ORGANIZING MAPS (SOM);

IRON ALLOYS;

EID: 0034244964     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200008)30:1<181::AID-SIA794>3.0.CO;2-J     Document Type: Article

References (5)

1. Kohonen T. Self-organising Maps, Springer Series in Information Sciences Vol. 30. Springer: Berlin, 1995.
2. Tokutaka H, Yoshihara K, Fujimura K, Iwamoto K, Obu-Cann K. Surf. Interface Anal. 1999; 27: 783.
3. Tokutaka H, Yoshihara K, Fujimura K, Obu-Cann K, Iwamoto K. Appl. Surf. Sci. 1999; 144/145: 59.
4. Tokutaka H, Fujimura K, Iwamoto K, Kishida S, Yoshihara K. Proc. ICONIP'97. Springer-Verlag: Singapore, 1997; 1318-1321.
5. Sasaki K, Kawata S, Minami S. Appl. Opt. 1984; 23: 1955.