XPS characterization of oxide films formed in cobalt-based alloys during corrosion tests at high temperature

Surface and Interface Analysis

Volumn 30, Issue 1, 2000, Pages 161-166

  Maffiotte, C ^a   Navas, M ^a   Castano M L ^a   Lancha, A M ^a  

^a CIEMAT   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM COMPOUNDS; CORROSION PROTECTION; CORROSION RESISTANCE; DISSOLUTION; FILM GROWTH; HEAT EXCHANGERS; OXIDES; PH EFFECTS; PRESSURIZED WATER REACTORS; PROTECTIVE COATINGS; X RAY PHOTOELECTRON SPECTROSCOPY;

CHROMIUM OXIDE; CORROSION TESTS; DEPTH PROFILING;

STELLITE;

EID: 0034244919     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200008)30:1<161::AID-SIA764>3.0.CO;2-O     Document Type: Article

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