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Volumn 30, Issue 1, 2000, Pages 589-591
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Thin film analysis of chromium-phosphate conversion coatings on aluminum probed by ToF-SIMS and electron probe X-ray analysis
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
CORROSION PROTECTION;
FLUORINE;
MICROANALYSIS;
PROTECTIVE COATINGS;
SECONDARY ION MASS SPECTROMETRY;
CHROMIUM PHOSPHATE COATINGS;
ELECTRON PROBE MICROANALYSIS;
ELEMENTAL COMPOSITION;
PHOSPHATE COATINGS;
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EID: 0034244727
PISSN: 01422421
EISSN: None
Source Type: Journal
DOI: 10.1002/1096-9918(200008)30:1<589::AID-SIA706>3.0.CO;2-N Document Type: Article |
Times cited : (8)
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References (8)
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