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Volumn 30, Issue 1, 2000, Pages 589-591

Thin film analysis of chromium-phosphate conversion coatings on aluminum probed by ToF-SIMS and electron probe X-ray analysis

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; CORROSION PROTECTION; FLUORINE; MICROANALYSIS; PROTECTIVE COATINGS; SECONDARY ION MASS SPECTROMETRY;

EID: 0034244727     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200008)30:1<589::AID-SIA706>3.0.CO;2-N     Document Type: Article
Times cited : (8)

References (8)
  • 8
    • 0342341035 scopus 로고    scopus 로고
    • PhD Thesis, University of Brussels, Brussels
    • Schram T. PhD Thesis, University of Brussels, Brussels, 1999.
    • (1999)
    • Schram, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.