Feasibility study to probe thin inorganic and organic coatings on aluminum substrates by means of visible and infrared spectroscopic ellipsometry

Surface and Interface Analysis

Volumn 30, Issue 1, 2000, Pages 507-513

  Schram, T ^a   Terryn, H ^a   Franquet, A ^a  

^a VRIJE UNIVERSITEIT BRUSSEL   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ALUMINUM; ELLIPSOMETRY; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MATHEMATICAL MODELS; ORGANIC COATINGS; SUBSTRATES; THIN FILMS;

INFRARED SPECTROSCOPIC ELLIPSOMETRY (IRSE); VISUAL SPECTROSCOPIC ELLIPSOMETRY;

INORGANIC COATINGS;

EID: 0034244724     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200008)30:1<507::AID-SIA753>3.0.CO;2-4     Document Type: Article

References (13)

1. De Laet J, Vanhellemont J, Terryn H, Vereecken J. Appl. Phys. 1991; A54: 72.
2. De Laet J, Terryn H, Vereecken J. Thin Solid Films 1998; 320: 241.
3. Schram T, De Laet J, Terryn H. J. Electrochem. Soc. 1998; 145(8): 2733.
4. Jellison GE Jr. Thin Solid Films 1996; 40: 290.
5. Terryn H, Vanhellemont J, Van Landuyt J, Vereecken J. Trans. Inst. Met Finish. 1990; 68: 33.
6. Smith DY, Shiles E, Inokuti M. In Handbook of Optical Constants of Solids, vol. 1. Palik ED (ed.). Academic Press: San Diego, 1998; 369-383.
7. Bruggeman DAG. Anal. Phys. 1935; 5: 638.
8. Gervais E. In Handbook of Optical Constants of Solids, vol. 1, Palik ED (ed.). Academic Press: San Diego, 1998; 761-763.
9. Fang SJ, Chen W, Yamanaka T, Helms CR. J. Electrochem. Soc. 1997; 144(8): L231.
10. Schram T. PhD Thesis, University VUB, Brussels, 1999.
11. Smith T. Surf. Interface Anal. 1978; 56: 252.
12. Grose P, Offerman V. Vib. Spectrosc. 1995; 8: 121.
13. Goeminne G, Terryn H, Vereecken J. Proc. 7th Symposium on Oxide Films on Metals and Alloys, vol. 94-25. The Electrochemical Society: Pennington, NJ, USA, 1994; 74.