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Volumn 43, Issue 6, 2000, Pages 497-502
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First results on SiCf-SiBC creep
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Author keywords
[No Author keywords available]
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Indexed keywords
CREEP TESTING;
CRYSTAL MICROSTRUCTURE;
ELASTIC MODULI;
INFILTRATION;
MICROCRACKING;
SCANNING ELECTRON MICROSCOPY;
SILICON CARBIDE;
STRAIN RATE;
TENSILE TESTING;
TRANSMISSION ELECTRON MICROSCOPY;
CHEMICAL VAPOR INFILTRATIONS;
MONOLITHIC CERAMICS;
SILICON BORON CARBIDE;
CERAMIC MATRIX COMPOSITES;
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EID: 0034244699
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6462(00)00451-6 Document Type: Article |
Times cited : (4)
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References (23)
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