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Volumn 3, Issue 4, 2000, Pages 251-255

Precipitation of Sn in metastable, pseudomorphic Si0.95Sn0.05 films grown by molecular beam epitaxy

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; MOLECULAR BEAM EPITAXY; MOSSBAUER SPECTROSCOPY; PRECIPITATION (CHEMICAL); SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTING TIN COMPOUNDS; SEMICONDUCTOR GROWTH; SOLUBILITY; SUBSTRATES;

EID: 0034240732     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-8001(00)00040-8     Document Type: Article
Times cited : (4)

References (15)
  • 6
    • 0007609576 scopus 로고
    • I.J. Gruverman, & C.W. Seidel. New York: Plenum Press
    • Weyer G. Gruverman I.J., Seidel C.W. Mössbauer effect methodology. 1976;301 Plenum Press, New York.
    • (1976) Mössbauer Effect Methodology , pp. 301
    • Weyer, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.