Measurement of the sensitivity and photometric accuracy of FT-IR spectrometers

Applied Spectroscopy

Volumn 54, Issue 8, 2000, Pages 1192-1202

  Bowie, Bryan T ^a   Griffiths, Peter R ^a  

^a UNIVERSITY OF IDAHO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PHOTOMETRY; POLYETHYLENE TEREPHTHALATES; SENSITIVITY ANALYSIS; SIGNAL PROCESSING; SPECTRUM ANALYSIS; STATISTICAL METHODS;

SIGNAL AVERAGING;

SPECTROMETERS;

EID: 0034239156     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702001950760     Document Type: Article

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