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Volumn 62, Issue 2, 2000, Pages R1485-R1488

Structural characterization of surface hexatic behavior in free-standing 4O.8 liquid-crystal films

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DIFFRACTION; PHASE DIAGRAMS; PHASE TRANSITIONS; SURFACE PROPERTIES; TEMPERATURE; THIN FILMS;

FREE STANDING LIQUID CRYSTAL FILMS; SURFACE HEXATIC BEHAVIOR;

SMECTIC LIQUID CRYSTALS;

EID: 0034238978 PISSN: 1063651X EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevE.62.R1485 Document Type: Article

Times cited : (5)

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