Electrical and electro-optical investigations of liquid crystal cells containing [Formula Presented] thin films

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 62, Issue 2, 2000, Pages 2263-2268

  Strangi, G ^a   Cazzanelli, E ^a   Scaramuzza, N ^a   Versace, C ^a   Bartolino, R ^a  

^a UNIVERSITY OF CALABRIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; ELECTRIC FIELD EFFECTS; ELECTRIC PROPERTIES; ELECTRODES; ELECTROOPTICAL EFFECTS; IONIC CONDUCTION; MAGNETRON SPUTTERING; MOLECULAR ORIENTATION; SPUTTER DEPOSITION; THIN FILMS; TRANSPORT PROPERTIES; TUNGSTEN COMPOUNDS;

ELECTROOPTICAL INVESTIGATIONS; ELECTROOPTICAL RESPONSE; INDIUM TIN OXIDE; IONIC DIFFUSION PROCESS; TUNGSTEN TRIOXIDE;

NEMATIC LIQUID CRYSTALS;

EID: 0034238750     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.62.2263     Document Type: Article

References (26)

1. L. M. Blinov and V. G. Chigrinov, Electrooptic Effects in Liquid Crystal Materials (Springer-Verlag, New York, 1994).
2. P. G. de Gennes and J. Prost, The Physics of Liquid Crystals (Oxford University Press, London, 1993).
3. C. G. Granqvist, Solid State Ionics 53–56, 479 (1992)
4. C. G. GranqvistAppl. Phys. A: Solids Surf. 57, 3 (1993).
5. S. K. Deb, Appl. Opt. Suppl. 3, 192 (1969)
6. S. K. DebPhilos. Mag. 27, 801 (1973).
7. V. E. Henrich and P. A. Cox, The Surface Science of Metal Oxides (Cambridge University Press, Cambridge, England, 1994).
8. J. V. Gabrusenoks, P. D. Cikmach, A. R. Lusis, J. J. Kleperis, and G. M. Ramans, Solid State Ionics 14, 25 (1984).
9. D. Dini, F. Decker, and E. Masetti, J. Appl. Electrochem. 26, 647 (1996).
10. H. Demiryont and K. E. Nietering, Appl. Opt. 28, 1494 (1989).
11. O. Lev, Z. Wu, S. Bharathi, V. Glezer, A. Modestov, J. Gun, L. Rabinovitch, and S. Samphath, Chem. Mater. 9, 2354 (1997).
12. K. Marszalek, Thin Solid Films 175, 227 (1989).
13. T. Nanba, T. Takahashi, and T. Kudo, J. Non-Cryst. Solids 178, 233 (1994).
14. T. Nishide and F. Mizukami, Thin Solid Films 259, 212 (1995).
15. M. Green and A. Travlos, Philos. Mag. B 51, 501 (1985).
16. H. R. Zeller and H. U. Beyeler, Appl. Phys. 13, 231 (1977).
17. J. A. Duffy, M. D. Ingram, and P. M. S. Monk, Solid State Ionics 58, 109 (1992).
18. J. Vondràk and J. Bludskà, Solid State Ionics 68, 317 (1994).
19. Cl. Bohnke, O. Bohnke, B. Carquille, and G. Robert, Solid State Ionics 6, 121 (1982).
20. T. Nanba, Y. Nishiyama, and I. Yasui, J. Mater. Res. 6, 1324 (1991)
21. T. Nanba and I. Yasui, J. Solid State Chem. 83, 304 (1989).
22. A. Agrawal and H. Habibi, Thin Solid Films 169, 257 (1989).
23. M. Kawaminami and T. Hirose, J. Phys. Soc. Jpn. 46, 864 (1979).
24. G. Strangi, D. E. Lucchetta, E. Cazzanelli, N. Scaramuzza, C. Versace, and R. Bartolino, Appl. Phys. Lett. 74, 534 (1999).
25. E. Cazzanelli, N. Scaramuzza, G. Strangi, C. Versace, A. Pennisi, and F. Simone, Electrochim. Acta 44, 3101 (1999).
26. W. Wagner, F. Rauch, C. Otterman, and K. Bange, Nucl. Instrum. Methods Phys. Res. B 68, 262 (1992).