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Volumn 56, Issue 8, 2000, Pages 1001-1003

Tetrakis(3, 4-ethylenedioxy-2-thienyl)silane carbon tetrachloride solvate

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ELECTROCHROMISM;

EID: 0034238705     PISSN: 01082701     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108270100006740     Document Type: Article
Times cited : (3)

References (19)
  • 15
    • 85037469984 scopus 로고    scopus 로고
    • 5.03. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • Siemens (1994). SHELXTL. Release 5.03. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
    • SHELXTL. Release
  • 16
    • 85037484406 scopus 로고    scopus 로고
    • 4.0. Siemens Analytical X-ray Instruments, Madison, Wisconsin, USA.
    • Siemens (1996). SMART and SAINT. Version 4.0. Siemens Analytical X-ray Instruments, Madison, Wisconsin, USA.
    • SMART and SAINT. Version


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.