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Volumn 80, Issue 7, 2000, Pages 1481-1493
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The contribution of the six-jump cycle to tracer diffusion in a two-dimensional ordered structure
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
DEFECTS;
DIFFUSION;
MONTE CARLO METHODS;
STOICHIOMETRY;
TEMPERATURE;
SIX-JUMP CYCLE;
TRACER DIFFUSION COEFFICIENTS;
TWO-DIMENSIONAL ORDERED STRUCTURE;
ALLOYS;
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EID: 0034236905
PISSN: 01418610
EISSN: None
Source Type: Journal
DOI: 10.1080/01418610008212132 Document Type: Article |
Times cited : (8)
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References (20)
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