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Volumn 12, Issue 7, 2000, Pages 885-887

Integrated signal monitoring and connection verification in MEMS optical crossconnects

Author keywords

[No Author keywords available]

Indexed keywords

MICROELECTROMECHANICAL DEVICES; MICROMACHINING; MIRRORS; OPTICAL BEAM SPLITTERS; PHOTODETECTORS; SCANNING ELECTRON MICROSCOPY; SIGNAL DETECTION; SIGNAL ENCODING; SWITCHING SYSTEMS;

EID: 0034230215     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.853537     Document Type: Article
Times cited : (15)

References (5)
  • 1
    • 0032094930 scopus 로고    scopus 로고
    • A novel optical-path supervisory scheme for optical cross connects in all-optical transport networks
    • C.-K. Chan, E. Kong, F. Tong, and L.-K. Chen, "A novel optical-path supervisory scheme for optical cross connects in all-optical transport networks," IEEE Photon. Technol. Lett., vol. 10, pp. 899-901, 1998.
    • (1998) IEEE Photon. Technol. Lett. , vol.10 , pp. 899-901
    • Chan, C.-K.1    Kong, E.2    Tong, F.3    Chen, L.-K.4
  • 2
    • 0032654580 scopus 로고    scopus 로고
    • Free-space micromachined optical switches for optical networking
    • Jan./Feb.
    • L. Y. Lin, E. L. Goldstein, and R. W. Tkach, "Free-space micromachined optical switches for optical networking," IEEE J. Select. Topics Quantum Electron, vol. 5, pp. 4-9, Jan./Feb. 1999.
    • (1999) IEEE J. Select. Topics Quantum Electron , vol.5 , pp. 4-9
    • Lin, L.Y.1    Goldstein, E.L.2    Tkach, R.W.3
  • 3
    • 0343013231 scopus 로고    scopus 로고
    • Cronos Integrated Microsystems Inc., Research Triangle Park, NC. [Online]
    • Cronos Integrated Microsystems Inc., Research Triangle Park, NC. [Online] Available http://www.memsrs.com
  • 5
    • 0033732890 scopus 로고    scopus 로고
    • On the expandability of free-space micromachined optical crossconnects
    • to be published
    • L. Y. Lin, E. L. Goldstein, and R. W. Tkach, "On the expandability of free-space micromachined optical crossconnects," J. Lightwave Technol., to be published.
    • J. Lightwave Technol.
    • Lin, L.Y.1    Goldstein, E.L.2    Tkach, R.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.