Optically thin palladium films on silicon-based substrates and nanostructure formation: effects of hydrogen

Applied Surface Science

Volumn 161, Issue 1, 2000, Pages 54-60

  Othonos, Andreas ^a   Kalli, Kyriacos ^a   Tsai, Din Ping ^b  

^a UNIVERSITY OF CYPRUS   (Cyprus)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITION EFFECTS; HYDROGEN; NANOSTRUCTURED MATERIALS; OPTICAL FILMS; REFRACTIVE INDEX; SILICON; SUBSTRATES; SURFACE STRUCTURE; THIN FILMS;

HYDROGEN EFFECTS; NANOSTRUCTURE FORMATION; OPTICALLY THIN PALLADIUM FILMS; SILICON BASED SUBSTRATES;

PALLADIUM;

EID: 0034229806     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00140-9     Document Type: Article

References (7)

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7. Erlandsson R., Eriksson M., Olsson L., Helmersson U., Lundström I., Petterson L.-G. J. Vac. Sci. Technol., B. 9:1991;825.