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Volumn 449, Issue 1, 2000, Pages 356-365

A Function using cubic splines for the analysis of alpha-particle spectra from silicon detectors

Author keywords

[No Author keywords available]

Indexed keywords

ALPHA PARTICLE SPECTROMETERS; ALPHA PARTICLES; BOUNDARY CONDITIONS; RELIABILITY; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICES; SPECTRUM ANALYSIS;

EID: 0034228543     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)01297-8     Document Type: Article
Times cited : (9)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.