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Volumn 449, Issue 1, 2000, Pages 356-365
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A Function using cubic splines for the analysis of alpha-particle spectra from silicon detectors
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Author keywords
[No Author keywords available]
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Indexed keywords
ALPHA PARTICLE SPECTROMETERS;
ALPHA PARTICLES;
BOUNDARY CONDITIONS;
RELIABILITY;
SEMICONDUCTING SILICON;
SEMICONDUCTOR DEVICES;
SPECTRUM ANALYSIS;
ALPHA PARTICLE SPECTRA;
SILICON DETECTORS;
PARTICLE DETECTORS;
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EID: 0034228543
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(99)01297-8 Document Type: Article |
Times cited : (9)
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References (15)
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