Microstructure control of in-situ-toughened α-SiAlON ceramics

Journal of the American Ceramic Society

Volumn 83, Issue 7, 2000, Pages 1819-1821

  Kim, Joosun ^a   Rosenflanz, Anatoly ^a,b   Chen, I Wei ^a  

^a UNIVERSITY OF PENNSYLVANIA   (United States)

^b 3M COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; FIRING (OF MATERIALS); FRACTURE TOUGHNESS; GRAIN BOUNDARIES; GRAIN GROWTH; LOW TEMPERATURE EFFECTS; NUCLEATION; PHASE COMPOSITION; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; TOUGHENING; X RAY DIFFRACTION ANALYSIS;

ELONGATED GRAINS; PHASE BOUNDARY; SEED CRYSTALS; SILICON ALUMINUMS OXYGEN NITRIDE CERAMICS;

SILICON COMPOUNDS;

EID: 0034228465     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2000.tb01472.x     Document Type: Article

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