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Volumn 12, Issue 27, 2000, Pages 5961-5970
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Study of the structure of porous silicon via positron annihilation experiments
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMS;
CRYSTAL DEFECTS;
ELECTRONS;
IRRADIATION;
PHOTOLUMINESCENCE;
PORE SIZE;
POSITRONS;
SPECTRUM ANALYSIS;
POSITRON ANNIHILATION RADIATION;
POSITRON LIFETIME MEASUREMENTS;
POSITRONIUM ATOMS;
POROUS SILICON;
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EID: 0034227739
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/12/27/314 Document Type: Article |
Times cited : (25)
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References (29)
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