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Volumn 19, Issue 14, 2000, Pages 2724-2729

Reduction of terphenyltrifluorosilanes: C-C insertion products and possible formation of a disilyne

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; CRYSTAL STRUCTURE; POTASSIUM; REACTION KINETICS; REDUCTION; SILICON; SODIUM; SYNTHESIS (CHEMICAL);

EID: 0034226753     PISSN: 02767333     EISSN: None     Source Type: Journal    
DOI: 10.1021/om990924z     Document Type: Article
Times cited : (72)

References (23)
  • 15
    • 0033553136 scopus 로고    scopus 로고
    • (b) Twamley, B.; Sofield, C. D.; Olmstead, M. M.; Power, P. P. J. Am. Chem. Soc. 1999, 121, 3357. Moreover, C-H insertion to give a silafluorene has been observed in the reduction of 2,4,6-triphenyl-phenyl-substituted trichlorosilane: Millevolte, A. J.; van den Winkel, Y.; Powell, D. R.; West, R. Organometallics 1997, 16, 5375.
    • (1999) J. Am. Chem. Soc. , vol.121 , pp. 3357
    • Twamley, B.1    Sofield, C.D.2    Olmstead, M.M.3    Power, P.P.4
  • 16
    • 0343925032 scopus 로고    scopus 로고
    • (b) Twamley, B.; Sofield, C. D.; Olmstead, M. M.; Power, P. P. J. Am. Chem. Soc. 1999, 121, 3357. Moreover, C-H insertion to give a silafluorene has been observed in the reduction of 2,4,6-triphenyl-phenyl-substituted trichlorosilane: Millevolte, A. J.; van den Winkel, Y.; Powell, D. R.; West, R. Organometallics 1997, 16, 5375.
    • (1997) Organometallics , vol.16 , pp. 5375
    • Millevolte, A.J.1    Van Den Winkel, Y.2    Powell, D.R.3    West, R.4
  • 19
    • 0005767033 scopus 로고
    • Siemens Analytical X-ray Instruments, 6300 Enterprise Dr., Madison, WI 53719-1173
    • (a) Data Collection: SMART Software Reference Manual; Siemens Analytical X-ray Instruments, 6300 Enterprise Dr., Madison, WI 53719-1173, 1994.
    • (1994) Data Collection: SMART Software Reference Manual
  • 20
    • 0005770925 scopus 로고
    • Siemens Analytical X-ray Instruments, 6300 Enterprise Dr., Madison, WI 53719-1173
    • (b) Data Reduction: SAINT Software Reference Manual; Siemens Analytical X-ray Instruments, 6300 Enterprise Dr., Madison, WI 53719-1173, 1995.
    • (1995) Data Reduction: SAINT Software Reference Manual
  • 22
    • 0004150157 scopus 로고
    • Siemens Analytical X-ray Instruments, 6300 Enterprise Dr., Madison, WI 53719-1173
    • (a) Sheldrick, G. M. SHELXTL Version 5 Reference Manual; Siemens Analytical X-ray Instruments, 6300 Enterprise Dr., Madison, WI 53719-1173, 1994.
    • (1994) SHELXTL Version 5 Reference Manual
    • Sheldrick, G.M.1
  • 23
    • 0038569732 scopus 로고
    • Tables 6.1.1.4, 4.2.6.8, and 4.2.4.2, Kluwer: Boston
    • (b) International Tables for Crystallography, Vol C; Tables 6.1.1.4, 4.2.6.8, and 4.2.4.2, Kluwer: Boston, 1995.
    • (1995) International Tables for Crystallography, Vol C , vol.100


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.