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Volumn 40, Issue 7, 2000, Pages 1157-1161
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Chip scale package issues
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Author keywords
[No Author keywords available]
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Indexed keywords
MICROPROCESSOR CHIPS;
RELIABILITY;
SOLDERED JOINTS;
CHIP SCALE PACKAGES (CSP);
ELECTRONICS PACKAGING;
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EID: 0034226652
PISSN: 00262714
EISSN: None
Source Type: Journal
DOI: 10.1016/S0026-2714(00)00041-X Document Type: Article |
Times cited : (7)
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References (3)
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