An X-ray reflectivity study of the water-docosane interface

Journal of Physical Chemistry B

Volumn 104, Issue 27, 2000, Pages 6336-6339

  Tikhonov, Aleksey M ^a   Mitrinovic, Dragoslav M ^a   Li, Ming ^a   Huang, Zhengqing ^b   Schlossman, Mark L ^a  

^a UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRON DENSITY MEASUREMENT; FREEZING; HYDROCARBONS; REFLECTION; SYNCHROTRONS; WATER; X RAY ANALYSIS;

CAPILLARY WAVE THEORY; DOCOSANE; SYNCHROTRON X RAY REFLECTIVITY;

INTERFACES (MATERIALS);

EID: 0034225417     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp001377u     Document Type: Article

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