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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 7 B, 2000, Pages 4486-4488

X-ray photoelectron spectroscopy study of hetero-interface between manganese pnictide and Mn-Zn ferrite

(6) Ikeda, Takeshi a Fujioka, Hiroshi a Ono, Kanta a Oshima, Masaharu a Yoshimoto, Mamoru b Koinuma, Hideomi b

a UNIVERSITY OF TOKYO (Japan)

b TOKYO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

Epitaxial growth; Manganese pnictide; MBE; Mn Zn ferrite; XPS

Indexed keywords

ANALYSIS; ANTIMONY; DIFFUSION; FERRITE; IRON; MANGANESE COMPOUNDS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SUBSTRATES; THICKNESS MEASUREMENT; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC;

DIFFUSION LENGTH; FILM THICKNESS; HETERO-INTERFACE; MANGANESE BISMUTH THIN FILMS; MANGANESE PNICTIDE; MANGANESE ZINC FERRITE SUBSTRATES; OUTDIFFUSION OF OXYGEN, ZINC, IRON;

HETEROJUNCTIONS;

EID: 0034225106 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.39.4486 Document Type: Article

Times cited : (4)

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