RHEED analysis of twinned homoepitaxial layers grown on Si(111)√3×√3-B

Thin Solid Films

Volumn 369, Issue 1, 2000, Pages 5-9

  Hibino, H ^a   Kawamura, T ^b   Ogino, T ^a  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

^b UNIVERSITY OF YAMANASHI   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; SEMICONDUCTING BORON; SEMICONDUCTING SILICON; SEMICONDUCTOR GROWTH; SUBSTRATES;

MULTIPLE SCATTERING THEORY; TWINNED EPITAXIAL LAYERS;

SEMICONDUCTING FILMS;

EID: 0034225071     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)00824-5     Document Type: Article

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