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Volumn 337, Issue 1, 2000, Pages 169-173

TEM study on the effects of intermediate quenching on some defects in high Jc Bi-2223 tapes

Author keywords

[No Author keywords available]

Indexed keywords

CRACKS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRYSTAL DEFECTS; GRAIN SIZE AND SHAPE; OXIDE SUPERCONDUCTORS; PRESSING (FORMING); QUENCHING; SINTERING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034224566     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(00)00081-2     Document Type: Article
Times cited : (1)

References (14)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.