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Volumn 337, Issue 1, 2000, Pages 169-173
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TEM study on the effects of intermediate quenching on some defects in high Jc Bi-2223 tapes
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Author keywords
[No Author keywords available]
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Indexed keywords
CRACKS;
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
CRYSTAL DEFECTS;
GRAIN SIZE AND SHAPE;
OXIDE SUPERCONDUCTORS;
PRESSING (FORMING);
QUENCHING;
SINTERING;
TRANSMISSION ELECTRON MICROSCOPY;
BISMUTH LEAD STRONTIUM CALCIUM COPPER OXIDES;
INTERMEDIATE QUENCHING;
MULTIFILAMENTARY TAPE;
BISMUTH COMPOUNDS;
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EID: 0034224566
PISSN: 09214534
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4534(00)00081-2 Document Type: Article |
Times cited : (1)
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References (14)
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