Electron-ion coincidence spectroscopy as a new tool for surface analysis - An application to the ice surface

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 7 B, 2000, Pages 4489-4492

  Tanaka, Shin Ichiro ^a,c   Mase, Kazuhiko ^a,d   Nagasono, Mitsuru ^a,e   Nagaoka, Shin Ichi ^a   Kamada, Masao ^a   Ikenaga, Eiji ^b   Sekitani, Tetsuji ^b   Tanaka, Ken Ichiro ^b  

^a INSTITUTE FOR MOLECULAR SCIENCE   (Japan)

^b HIROSHIMA UNIVERSITY   (Japan)

^c NAGOYA UNIVERSITY   (Japan)

^d HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

^e LUND UNIVERSITY   (Sweden)

Author keywords

Electron ion coincidence spectroscopy; Ice; Ion desorption; Surface, H2O; XPS

Indexed keywords

CORE ANALYSIS; DESORPTION; ELECTRIC EXCITATION; ELECTRON SPECTROSCOPY; HYDROGEN; ICE; IONS; KINETIC ENERGY; OXYGEN; X RAY PHOTOELECTRON SPECTROSCOPY;

CORELEVEL EXCITATION; ELECTRON-ION COINCIDENCE SPECTROSCOPY; HYDROGEN IONS; ICE SURFACE; PHOTOELECTRONS; SURFACE ANALYSIS;

CHEMICAL ANALYSIS;

EID: 0034224504     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.4489     Document Type: Article

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