Eddy current interaction with a thin-opening crack in a plate conductor

IEEE Transactions on Magnetics

Volumn 36, Issue 4 I, 2000, Pages 1745-1749

  Dezhi, Chen ^a   Shao, K R ^a   Jianni, Sheng ^b   Weili, Yan ^c  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b XI'AN JIAOTONG UNIVERSITY   (China)

^c HEBEI UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRACKS; CURRENT DENSITY; EDDY CURRENT TESTING; GREEN'S FUNCTION; INTEGRAL EQUATIONS; PERTURBATION TECHNIQUES;

CURRENT DIPOLE LAYERS; PLATE CONDUCTORS; THIN OPENING CRACKS;

ELECTRIC CONDUCTORS;

EID: 0034222094     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.877781     Document Type: Article

References (6)