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Volumn 36, Issue 4 I, 2000, Pages 1706-1709
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Simulation of thin cracks with finite resistivity in eddy current testing
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
CRACKS;
EDDY CURRENT TESTING;
ELECTRIC CONDUCTIVITY;
ELECTRIC POTENTIAL;
INTEGRAL EQUATIONS;
MAGNETIC FIELD EFFECTS;
FINITE RESISTIVITY;
ELECTRIC CONDUCTORS;
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EID: 0034219655
PISSN: 00189464
EISSN: None
Source Type: Journal
DOI: 10.1109/20.877771 Document Type: Article |
Times cited : (12)
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References (6)
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