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Volumn 36, Issue 4 I, 2000, Pages 1706-1709

Simulation of thin cracks with finite resistivity in eddy current testing

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRACKS; EDDY CURRENT TESTING; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; INTEGRAL EQUATIONS; MAGNETIC FIELD EFFECTS;

EID: 0034219655     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.877771     Document Type: Article
Times cited : (12)

References (6)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.