Thin film write head field analysis using a benchmark problem

IEEE Transactions on Magnetics

Volumn 36, Issue 4 I, 2000, Pages 1784-1787

  Fujiwara, Koji ^b   Ikeda, Fumiaki ^c   Kameari, Akihisa ^d   Kanai, Yasushi ^a,e   Nakamura, Kimio ^f   Takahashi, Norio ^a,b   Tani, Koji ^a,g   Yamada, Takashi ^a,g  

^a IEEE

^b OKAYAMA UNIVERSITY   (Japan)

^c PHOTON Co Ltd   (Japan)

^d Research Group of Science Solutions International Laboratory Inc   (Japan)

^e NIIGATA INSTITUTE OF TECHNOLOGY   (Japan)

^f HITACHI LTD   (Japan)

^g Japan Research Institute   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; COMPUTERIZED TOMOGRAPHY; EDDY CURRENTS; FINITE ELEMENT METHOD; MAGNETIC HEADS; MAGNETIC RECORDING;

BENCHMARK PROBLEMS; MAGNETIC RECORDING WRITE HEAD; STROBOSCOPIC ELECTRON BEAM TOMOGRAPHY; THREE DIMENSIONAL NONLINEAR EDDY CURRENT ANALYSIS;

MAGNETIC THIN FILMS;

EID: 0034219578     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.877789     Document Type: Article

References (9)