Heat analysis of a fuse for semiconductor devices protection using 3-D finite element method

IEEE Transactions on Magnetics

Volumn 36, Issue 4 I, 2000, Pages 1377-1380

  Kawase, Yoshihiro ^a,b   Miyatake, Tsutomu ^b   Ito, Shokichi ^c  

^a IEEE   (Japan)

^b GIFU UNIVERSITY   (Japan)

^c FUKUOKA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT LIMITING FUSES; HEAT ANALYSIS;

ELECTRIC CURRENTS; ERROR ANALYSIS; FINITE ELEMENT METHOD; LIMITERS; MATHEMATICAL MODELS; SEMICONDUCTOR DEVICES; THERMOANALYSIS;

ELECTRIC FUSES;

EID: 0034219574     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.877695     Document Type: Article

References (2)