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Volumn 220, Issue 1, 2000, Pages 697-701
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Characterization of the plasma during the growth of CNx films by RF magnetron sputtering
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0034215726
PISSN: 03701972
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-3951(200007)220:1<697::AID-PSSB697>3.0.CO;2-Q Document Type: Article |
Times cited : (2)
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References (16)
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