Functional limit laws for the increments of Kaplan-Meier product-limit processes and applications

Annals of Probability

Volumn 28, Issue 3, 2000, Pages 1301-1335

  Deheuvels, Paul ^a   Einmahl, John H J ^b  

^a Dept of Math and Computing Science ^*  (France)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Density and hazard rate estimation; Functional law of the iterated logarithm; Random censorship; Strong limit theorems

Indexed keywords

EID: 0034214588     PISSN: 00911798     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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