Characterization of film surface treated with ECR plasma by Doppler broadening

Radiation Physics and Chemistry

Volumn 58, Issue 5-6, 2000, Pages 607-614

  Nishijima, S ^a   Yagi, T ^a   Hirata, K ^b   Kobayashi, Y ^b   Honda, Y ^a   Tagawa, S ^a  

^a OSAKA UNIVERSITY   (Japan)

^b NATL INST OF MAT AND CHEM RES   (Japan)

Author keywords

Doppler broadening; Plasma treatment; Polar groups; Polyethylene film; Positron beam

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; ELECTRON CYCLOTRON RESONANCE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; PLASMA APPLICATIONS; PLASTIC FILMS; POLYETHYLENES; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES; SURFACE TENSION; SURFACE TREATMENT;

DOPPLER BROADENING; POLAR GROUPS; POLYETHYLENE FILMS; POSITRON ANNIHILATION MEASUREMENTS; POSITRON BEAM TECHNIQUE; SESSILE DROP METHOD;

POSITRONS;

POLYETHYLENE;

ADHESION; CONFERENCE PAPER; CONTACT ANGLE; DEGRADATION; DESTRUCTION; MOLECULAR DYNAMICS; POSITRON; RADIATION BEAM; SCANNING ELECTRON MICROSCOPY; STRENGTH; SURFACE PROPERTY; SURFACE TENSION; WETTABILITY;

EID: 0034214384     PISSN: 0969806X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0969-806X(00)00227-9     Document Type: Conference Paper

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