Reduction of space charge effects in inductively coupled plasma mass spectrometry using a supplemental electron source inside the skimmer: Ion transmission and mass spectral characteristics

Analytical Chemistry

Volumn 72, Issue 11, 2000, Pages 2356-2361

  Praphairaksit, Narong ^a   Houk, R S ^a  

^a IOWA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC METHOD; ARTICLE; ATMOSPHERIC PRESSURE; ELECTRON MICROSCOPY; ELECTRON TRANSPORT; EXTRACTION; GAS CHROMATOGRAPHY; GAS FLOW; ION TRANSPORT; MASS SPECTROMETRY;

EID: 0034213695     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac000159u     Document Type: Article

References (28)

1. Olivares, J. A.; Houk, R. S. Anal. Chem. 1985, 57, 2674-2679.
2. Gillson, G. R.; Douglas, D. J.; Fulford, J. E.; Halligan, K. W.; Tanner, S. D. Anal. Chem. 1988, 60, 1472-1474.
3. Tanner, S. D. Spectrochem. Acta, Part B 1992, 47, 809-823.
4. Douglas, D. J.; Tanner, S. D. Fundamental Considerations in ICPMS. In Inductively Coupled Plasma Mass Spectrometry: Montaser, A., Ed.; Wiley-VCH: New York, 1998; pp 656-666.
5. Tan, S. H.; Horlick G. J. Anal. At. Spectrom. 1987, 2, 745-751.
6. Gregoire, D. C. Appl. Spectrosc. 1987, 41, 897-903.
7. Evans, E. H.; Giglio, J. J. J. Anal. At. Spectrom. 1993, 8, 1-18.
8. Douglas, D. J.; French, J. B. J. Anal. At. Spectrom. 1988, 3, 743-747.
9. Niu, H.; Houk, R. S. Spectrochem. Acta, Part B 1994, 49, 1283-1303; 1995, 50, 1247-1261.
10. Niu, H.; Houk, R. S. Spectrochem. Acta, Part B 1994, 49, 1283-1303; 1995, 50, 1247-1261.
11. Niu, H.; Houk, R. S. Spectrochim. Acta, Part B 1996, 51, 779-815.
12. Tanner, S. D.; Cousins, L. M.; Douglas, D. J. Appl. Spectrosc. 1994, 48, 1367-1372.
13. Tanner, S. D.; Douglas, D. J.; French, J. B. Appl. Spectrosc. 1994, 48, 1373-1378.
14. Allen, L. A.; Leach, J. J.; Houk, R. S. Anal. Chem. 1997, 69, 2884-2391.
15. Stewart, I. I.; Olesik, J. W. J. Am. Soc. Mass Spectrom. 1999, 10, 159-174.
16. Turner, P. J. Some Observations on Mass Bias Effects Occurring in ICP-MS Systems, In Applications of Plasma Source Mass Spectrometry; Holland, G., Eaton, A. N., Eds.; Royal Society of Chemistry: Cambridge, U.K., 1991; pp 71-78.
17. Ross, B. S.; Hieftje, G. M. Spectrochim. Acta, Part B, 1991, 46, 1263-1273.
18. Hu, K.; Clemons, P. S.; Houk, K. S. J. Am. Soc. Mass Spectrom. 1993, 4, 16-27.
19. Hu, K.; Houk, R. S. J. Am. Soc. Mass Spectrom. 1993, 4, 28-37.
20. Denoyer, E. R.; Jacques, M. D.; Debrah, E.; Tanner, S. D. At. Spectrosc. 1995, 16, 1-6.
21. Praphairaksit, N.; Houk, R. S. Anal. Chem. 2000, 72, 2351-2355.
22. Clemons, P. S.; Minnich, M. G.; Houk, R. S. Anal. Chem. 1995, 67, 1929-1934.
23. Koontz, S. L.; Denton, M. B. Int. J. Mass Spectrom. Ion Phys. 1981, 37, 227-239.
24. Grix, R.; Gruner, U.; Li, G.; Stroh, H.; Wollnik, H. Int. J. Mass Spectrom. Ion Processes 1989, 93, 323-330.
25. Amad, M. H.; Houk, R. S. J. Am. Soc. Mass Spectrom. 2000, 11, 407-415.
26. Praphairaksit, N.; Houk, R. S. Anal. Chem., submitted.
27. Scalf, M.; Westphall, M. S.; Smith, L. M. Anal. Chem. 2000, 72, 52-60.
28. Busman, M.; Vogel, C. R.; Sunner, J. J. Am. Soc. Mass Spectrom. 1991, 2, 1-10.