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Journal of Materials Research

Volumn 15, Issue 6, 2000, Pages 1389-1396

Structural studies of pulsed-laser-deposited Ba4Fe4Ti3O16 oxide films

(4) Bendersky, L A a Maier, R b Cohn, J L b Neumeier, J J c

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

b Department of Biology (United States)

c FLORIDA ATLANTIC UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; MORPHOLOGY; PEROVSKITE; POSITIVE IONS; PULSED LASER DEPOSITION; STABILITY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

OXIDE FILMS;

SINGLE CRYSTALS;

EID: 0034211117 PISSN: 08842914 EISSN: None Source Type: Journal
DOI: 10.1557/JMR.2000.0201 Document Type: Article

Times cited : (5)

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