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Volumn 39, Issue 6 B, 2000, Pages 3717-3720

Differentiation of Au islands on Ni film by friction force microscopy, force curve and new force modulation method

Author keywords

Au islands; Force curve; Friction force microscope; Magnetic force controlled AFM (MFC AFM); Ni film; Stiffness

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFORMATION; GOLD; METALLIC FILMS; NICKEL; STIFFNESS;

FORCE CURVE MEASUREMENT; FORCE MODULATION METHOD; FRICTION FORCE MICROSCOPY (FFM); HERTZIAN RADIUS;

ELECTRODES;

EID: 0034207159 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.39.3717 Document Type: Article

Times cited : (7)

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