Pulse-characterization at 1.5 μm using time-resolved optical gating based on dispersive propagation

IEEE Photonics Technology Letters

Volumn 12, Issue 6, 2000, Pages 666-668

  Koumans, Roger G M P ^a   Yariv, Amnon ^a  

^a California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; FOURIER TRANSFORMS; LIGHT PROPAGATION; OPTICAL BEAM SPLITTERS; OPTICAL COLLIMATORS; OPTICAL CORRELATION; OPTICAL VARIABLES MEASUREMENT; SEMICONDUCTOR LASERS;

OPTICAL PULSE COMPRESSION; OPTICAL PULSE MEASUREMENTS; SEMICONDUCTOR MODE LOCKED LASER; TIME RESOLVED OPTICAL GATING; ULTRASHORT OPTICAL PULSES;

CORRELATORS;

EID: 0034206667     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/68.849078     Document Type: Article

References (7)

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