A comparison between parametric and non-parametric approaches to the analysis of replicated spatial point patterns

Advances in Applied Probability

Volumn 32, Issue 2, 2000, Pages 331-343

  Diggle, Peter J ^a   Mateu, Jorge ^b   Clough, Helen E ^c  

^a LANCASTER UNIVERSITY   (United Kingdom)

^b UNIVERSITAT JAUME I   (Spain)

^c UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

Expected significance levels; K function; Pseudo likelihood function; Replicated spatial point patterns; Spatial analysis of variance

Indexed keywords

COMPUTER SIMULATION; DATA REDUCTION; MATHEMATICAL MODELS; PARAMETER ESTIMATION; POISSON DISTRIBUTION;

BOOTSTRAP TESTING PROCEDURE; EXPECTED SIGNIFICANCE LEVELS; K-FUNCTION; PSEUDO LIKELIHOOD FUNCTION; REPLICATED SPATIAL POINT PATTERNS; SPATIAL ANALYSIS OF VARIANCE;

STATISTICAL METHODS;

EID: 0034206290     PISSN: 00018678     EISSN: None     Source Type: Journal    
DOI: 10.1239/aap/1013540166     Document Type: Article

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