Elimination of shunting conductance effects in a low-cost capacitive-sensor interface

IEEE Transactions on Instrumentation and Measurement

Volumn 49, Issue 3, 2000, Pages 531-534

  Li, Xiujun ^b   Meijer, Gerard C M ^a,b  

^a IEEE

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CAPACITANCE MEASUREMENT; CAPACITORS; ELECTRIC CONDUCTANCE; MATHEMATICAL MODELS; MICROCONTROLLERS; OSCILLATORS (ELECTRONIC);

AUTOCALIBRATION TECHNIQUE; CAPACITIVE SENSOR; SENSOR INTERFACE; SHUNTING CONDUCTANCE EFFECTS;

SENSORS;

EID: 0034205796     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.850389     Document Type: Article

References (8)

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