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Volumn 43, Issue 1, 2000, Pages 63-68
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Simulation of primary recrystallization from TEM orientation data
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Author keywords
[No Author keywords available]
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Indexed keywords
BACKSCATTERING;
COMPUTER SIMULATION;
CRYSTAL MICROSTRUCTURE;
CRYSTAL ORIENTATION;
ELECTRON DIFFRACTION;
ELECTRON SCATTERING;
IRON ALLOYS;
SCANNING ELECTRON MICROSCOPY;
TRANSMISSION ELECTRON MICROSCOPY;
ELECTRON BACKSCATTERED DIFFRACTION (EBSD);
RECRYSTALLIZATION (METALLURGY);
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EID: 0034205464
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6462(00)00365-1 Document Type: Article |
Times cited : (30)
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References (18)
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