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Volumn 43, Issue 1, 2000, Pages 63-68

Simulation of primary recrystallization from TEM orientation data

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; COMPUTER SIMULATION; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; ELECTRON DIFFRACTION; ELECTRON SCATTERING; IRON ALLOYS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034205464     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(00)00365-1     Document Type: Article
Times cited : (30)

References (18)
  • 12
    • 0343781333 scopus 로고
    • Ph.D. Thesis, Yale University
    • S. I. Wright, Ph.D. Thesis, Yale University (1992).
    • (1992)
    • Wright, S.I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.