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Volumn 159, Issue , 2000, Pages 387-391
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Molecular dynamics analysis of point defects in silicon near solid-liquid interface
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Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVATION ENERGY;
COMPUTER SIMULATION;
CRYSTAL GROWTH;
DIFFUSION;
HEAT TRANSFER;
MASS TRANSFER;
MOLECULAR DYNAMICS;
PHASE INTERFACES;
POINT DEFECTS;
PRESSURE EFFECTS;
SINGLE CRYSTALS;
STILLINGER-WEBER POTENTIAL;
SEMICONDUCTING SILICON;
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EID: 0034205183
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(00)00121-5 Document Type: Article |
Times cited : (3)
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References (20)
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