High-resolution X-ray study of specular and diffuse scattering from Ni/C multilayer upon annealing

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 448, Issue 1, 2000, Pages 276-281

  Chernov, V A ^a   Chkhalo, E D ^a   Kovalenko, N V ^a   Mytnichenko, S V ^b  

^a BUDKER INSTITUTE OF NUCLEAR PHYSICS   (Russian Federation)

^b INSTITUTE OF SOLID STATE CHEMISTRY AND MECHANOCHEMISTRY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DECOMPOSITION; INTERFACES (MATERIALS); LASER ABLATION; OPTICAL PROPERTIES; SURFACE ROUGHNESS; TEMPERATURE; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

INTERFACIAL ROUGHNESS; X RAY DIFFUSE SCATTERING;

MULTILAYERS;

EID: 0034205018     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(99)00741-X     Document Type: Article

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