X-ray detection characteristics of thallium bromide nuclear radiation detectors

IEEE Transactions on Nuclear Science

Volumn 47, Issue 3 PART 2, 2000, Pages 777-779

  Hitomi, K ^a   Muroi, O ^a   Matsumoto, M ^a   Hirabuki, R ^a   Shoji, T ^a   Hiratate, Y ^a  

^a TOHOKU INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM; COMPUTERIZED TOMOGRAPHY; CRYSTAL GROWTH FROM MELT; ELECTRODES; ELECTRON ENERGY LEVELS; GOLD; PURIFICATION; SEMICONDUCTOR DEVICE MANUFACTURE; TEMPERATURE; THALLIUM COMPOUNDS; X RAY SPECTROSCOPY; X RAYS;

CURRENT MODE; FLUX DETECTORS; QUANTUM PULSE MODE; SEMICONDUCTOR X RAY DETECTORS; THALLIUM BROMIDE; TRAVELING MOLTEN ZONE METHOD; X RAY DETECTION;

SEMICONDUCTOR COUNTERS;

EID: 0034204797     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.856514     Document Type: Article

References (9)

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