Phase-measuring profilometry in large scale measurement

Guangxue Xuebao/Acta Optica Sinica

Volumn 20, Issue 6, 2000, Pages 792-796

  Li, Wansong ^a   Su, Likun ^a   Su, Xianyu ^a  

^a SICHUAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CONTOUR MEASUREMENT; IMAGE PROCESSING; OPTIMIZATION; PHASE MEASUREMENT; THREE DIMENSIONAL;

COORDINATE MAPPING; IMAGE SPLICE; PHASE MEASURING PROFILOMETRY;

SURFACE MEASUREMENT;

EID: 0034204113     PISSN: 02532239     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (6)