Ins and outs of digital electron microscopy

Microscopy Research and Technique

Volumn 49, Issue 3, 2000, Pages 217-223

  Koeck, Philip J B ^a  

^a KAROLINSKA INSTITUTE   (Sweden)

Author keywords

Aliasing; Automation; Charge coupled device; Detection quantum efficiency; Digital imaging; Digitization; DQE; Dynamic range; Film; Geometric accuracy; Imaging plate; Modulation transfer function; MTF; Nyquist frequency; Quantization; Sampling; Signal to noise ratio; Slow scan CCD camera; SNR; SSC; Transmission electron microscopy

Indexed keywords

CCD CAMERAS; CHARGE COUPLED DEVICES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; OPTICAL TRANSFER FUNCTION; QUANTIZATION (SIGNAL);

ALIASING; CHARGE COUPLED DEVICES CAMERA; DETECTION QUANTUM EFFICIENCIES; DIGITAL IMAGING; DIGITISATION; DQE; DYNAMIC RANGE; GEOMETRIC ACCURACY; IMAGING PLATE; MTF; NYQUIST FREQUENCY; QUANTISATION; SLOW-SCAN CHARGE COUPLED DEVICE CAMERA; SNR; SSC;

SIGNAL TO NOISE RATIO;

ACCURACY; ARTICLE; ARTIFACT; AUTOMATION; CAMERA; DYNAMICS; ELECTRON MICROSCOPY; FILM; GEOMETRY; IMAGING SYSTEM; INFORMATION PROCESSING; MODULATION TRANSFER FUNCTION; PRIORITY JOURNAL; QUANTUM MECHANICS; RECORDING; SAMPLING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034194309     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0029(20000501)49:3<217::AID-JEMT1>3.0.CO;2-3     Document Type: Article

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