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Volumn 225, Issue 1, 2000, Pages 243-246
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Investigation of thin aqueous films on silica using a modified interferometric technique
a b c d a |
Author keywords
Disjoinning pressure; Free bubble method; Micro interferometric technique; Silica; Thin aqueous films
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Indexed keywords
ELECTROLYTE;
NITROGEN;
SILICON DIOXIDE;
WATER;
ARTICLE;
FILM;
INTERFEROMETRY;
IONIC STRENGTH;
LIQUID;
PREDICTION;
PRIORITY JOURNAL;
THICKNESS;
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EID: 0034193364
PISSN: 00219797
EISSN: None
Source Type: Journal
DOI: 10.1006/jcis.2000.6735 Document Type: Article |
Times cited : (10)
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References (26)
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