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Volumn 20, Issue 1, 2000, Pages 65-74
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Comparison of minority carrier diffusion length measurements in silicon solar cells by the photo-induced open-circuit voltage decay (OCVD) with different excitation sources
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Author keywords
Diffusion length; Minority carrier lifetime; Photo induced open circuit voltage decay; Silicon photovoltaic solar cells
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Indexed keywords
CARRIER CONCENTRATION;
CRYSTALLINE MATERIALS;
DIFFUSION;
ELECTRIC EXCITATION;
LASERS;
POLYCRYSTALLINE MATERIALS;
STROBOSCOPES;
XENON;
DIFFUSION LENGTH;
EXCITATION SOURCES;
MINORITY CARRIER LIFETIME;
PHOTO INDUCED OPEN CIRCUIT VOLTAGE DECAY;
XENON STROBOSCOPE LAMP;
SILICON SOLAR CELLS;
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EID: 0034190387
PISSN: 09601481
EISSN: None
Source Type: Journal
DOI: 10.1016/S0960-1481(99)00089-0 Document Type: Article |
Times cited : (17)
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References (9)
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