Effect of magnetic annealing on the τ-phase of MnAl thin films

Journal of Magnetism and Magnetic Materials

Volumn 213, Issue 3, 2000, Pages 335-339

  Fischer, G A ^a   Rudee, M L ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ANNEALING; MAGNETIC FIELD EFFECTS; METALLOGRAPHIC PHASES; SPUTTER DEPOSITION; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

MAGNETIC ANNEALING; POST DEPOSITION ANNEALING;

MANGANESE ALLOYS;

EID: 0034188675     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(00)00007-X     Document Type: Article

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