Photoelectron spectroscopy study of Al-Cu interfaces

Surface Science

Volumn 452, Issue 1-3, 2000, Pages 161-171

  Geng, J ^a   Oelhafen, P ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COPPER ALLOYS; CURRENT DENSITY; MAGNETIC THIN FILMS; MAGNETRON SPUTTERING; SPUTTER DEPOSITION; STOICHIOMETRY; SUBSTRATES; TEMPERATURE; X RAY PHOTOELECTRON SPECTROSCOPY;

ALUMINUM COPPER INTERFACES; COPPER SUBSTRATES; SUBSTRATE TEMPERATURE;

INTERFACES (MATERIALS);

EID: 0034188449     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00312-5     Document Type: Article

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