Characterization of MCM-48 materials

Langmuir

Volumn 16, Issue 10, 2000, Pages 4648-4654

  Schumacher, Kai ^a   Ravikovitch, Peter I ^a   Du Chesne, Alexander ^a   Neimark, Alexander V ^a   Unger, Klaus K ^a  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION ISOTHERMS; ARGON; CHARACTERIZATION; MOLECULAR SIEVES; NITROGEN; PORE SIZE; SCANNING ELECTRON MICROSCOPY; STRUCTURE (COMPOSITION); SYNTHESIS (CHEMICAL); TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

MESOPOROUS MOLECULAR SIEVES; NONLOCAL DENSITY FUNCTIONAL THEORY; PORE STRUCTURE; PORE WALL THICKNESS;

COLLOIDS;

EID: 0034188367     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la991595i     Document Type: Article

References (45)