Run-related probability functions applied to sampling inspection

Technometrics

Volumn 42, Issue 2, 2000, Pages 188-202

  Shmueli, Galit ^a   Cohen, Ayala ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

Partial fraction expansion; Runs; Sampling inspection

Indexed keywords

ALGORITHMS; INSPECTION; POLYNOMIALS; PROBABILITY DENSITY FUNCTION; PROBABILITY DISTRIBUTIONS; RECURSIVE FUNCTIONS; SAMPLING;

PARTIAL FRACTION EXPANSION; RUN RELATED DISTRIBUTIONS;

QUALITY CONTROL;

EID: 0034187849     PISSN: 00401706     EISSN: None     Source Type: Journal    
DOI: 10.1080/00401706.2000.10485998     Document Type: Article

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